Automated parametric Rietveld refinement and its application to two- dimensional X-ray powder diffraction experiments
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IN THIS ISSUE Rietveld Refinement from Powder Diffraction Data
CPD chairman’s message, Paolo Scardi 2 CPD projects: 2 Quantitative Phase Analysis RR, Ian Madsen Editor’s message, Robert Dinnebier 2 Thirty five years ago, Hugo Rietveld 3 WWW sites related to Powder Diffraction 5 IUCr Commission on Powder Diffraction 5 Rietveld Refinement from Powder Diffraction Data Beyond the abilities of Rietveld analysis: MEM-based pattern fitting with synchrotron X-ray ...
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